Presentation Information
[10p-PA2-17]High-throughput I-V Chatacterization of NiO/ZnO Heterosutructures by PLD
〇Ren Koguchi1, Takahashi Ryota1 (1.Nihon Univ.)
Keywords:
High-throughput I-V measurement
Comment
To browse or post comments, you must log in.Log in
