Presentation Information
[11a-A33-5]Development of a Simple Method for Measuring the Density of States Using Finate-Difference Photoelectron Yield Spectroscopy
〇(M1)Kasumi Koshiba1, Manato Tateno1, Ryo Ozaki1, Hirohiko Fukagawa1,2,3, Hisao Ishii1,2,3 (1.GSSE Chiba Univ., 2.CFS Chiba Univ., 3.MCRC Chiba Univ.)
Keywords:
photoelectron yield spectroscopy,organic semiconductor,photoelectron emission spectroscopy
Photoelectron Yield Spectroscopy (PYS) is widely used to measure the density of states (DOS) in device development due to its simplicity. However, this technique has limitations in measurement accuracy. In this study, we attempted to establish a simple DOS measurement method, termed finite-difference photoelectron yield spectroscopy (FD-PYS). The method incorporates a retarding electrode configuration into a conventional PYS system. Measurements performed on samples such as Alq3 showed that the spectra obtained by FD-PYS were in good agreement with those obtained using other measurement techniques. These results demonstrate that FD-PYS enables reliable DOS measurements.