[11a-E206-1~11] 13.2 Exploratory Materials, Physical Properties, Devices

9:00 AM - 9:15 AM JST(12:00 AM - 12:15 AM UTC)

[11a-E206-1] Distribution of Carrier Concentration in Mg₂Si Crystals Measured by Microscopic FTIR Mapping

Minoru Okawara¹, Koutaro Tetsu¹, Kousuke Shimano¹, Shunya Sakane¹, 〇Haruhiko Udono¹ (1.Ibaraki University)

Keywords:

Mg2Si,FTIR,Single crystal