Presentation Information
[11p-E207-1]Verification of Charged-Particle-Induced X-ray/Gamma-ray (PIXE, PIGE) Analysis Using 30 MeV Proton Beam
〇Wataru Kada1, Ayumi Nakatsuma1, Yuki Ohtsuka1, Takeaki Goto1, Chihiro Iwamoto2, Yuho Hirata3, Hiroshi Sakurai4, Sho Toyama1, Misako Miwa1, Shigeo Matsuyama1 (1.Sch. Eng, Tohoku Univ., 2.RARiS, 3.JAEA, 4.Gunma Univ.)
Keywords:
PIXE,PIGE,High energy proton
Particle-induced X-ray (PIXE) and gamma-ray (PIGE) analysis are widely utilized ion beam analysis techniques that facilitate non-destructive, simultaneous multi-element analysis. Typically, proton beams with energies of several MeV are utilized for PIXE/PIGE analysis; however, their limited range imposes constraints on the analysis of thick samples and measurements in the atmosphere. Conversely, while higher-energy proton beams alleviate the limitations on range, concerns arise regarding the decrease in inner-shell ionization cross sections and the increase in continuous background components originating from bremsstrahlung and nuclear reaction γ-rays; therefore, evaluating analytical sensitivity and the signal-to-noise ratio (SNR) is crucial. In this study, the characteristic X-ray production efficiency and continuous X-ray components for proton beams in the 10–100 MeV range were evaluated by numerical calculations. Furthermore, based on these numerical studies, experimental verification was conducted using a 30–50 MeV proton beam supplied by the AVF cyclotron at the Research Center for Advanced Quantum Beam Science (RARiS) at Tohoku University. The findings of this study suggest that PIXE/PIGE analysis utilising proton beams of 30 MeV or higher can serve as a valuable method to complement conventional techniques in the analysis of thick samples, the analysis of medium- and heavy-element elements, and the analysis of specific elements and nuclides via γ-rays generated by nuclear reactions utilising high-energy nuclear reactions.