Presentation Information

[11p-E308-1]Layer number dependence of dielectric screening effects in WSe2
probed with broadband sum-frequency-generation spectroscopy

〇Shintaro Megumi1, Satoshi Kusaba1,2, Jun Takeda1,3, Takashi Taniguchi4, Kenji Watanabe4, Kazuhiro Yanagi2, Hirokazu Tahara1, Ikufumi Katayama1 (1.Dept. of Phys., Yokohama Natl. Univ., 2.Dept. of Phys., Tokyo Metro. Univ., 3.Shibaura Inst. of Tech., 4.NIMS)

Keywords:

transition metal dichalcogenides,Coulomb engineering