Presentation Information

[8a-E201-6]Angle-Resolved X-ray Photoelectron Spectroscopy Study of Concentration Profile of Fullerene in a Perovskite Layer

〇Koki Sawai1, Masato Iwasawa2, Hiroyuki Yoshida1,3 (1.Chiba Univ., 2.Nissan Chem. Corp., 3.Chiba Univ. MCRC)

Keywords:

Perovskite Solar Cells,Angle-Resolved X-ray Photoelectron Spectroscopy,Fullerene

We have evaluated the penetration structure of C60 into CH3NH3PbI3 layers, which is used as electron-collecting layers in p-i-n perovskite solar cells, by UPS, MAES, SEM, and GCIB-SIMS. In this study, for a triple-cation perovskite, we estimated the concentration profile of C60 based on the intensity analysis of ARXPS. The results showed that, as in CH3NH3PbI3, C60 penetrated into the perovskite film over time and was mainly located just beneath the surface.