Presentation Information
[8a-PA2-22]Estabilishment of a measurement system for current-voltage characteristics under ion beam irradiation for the evaluation of the radiation hardness of semiconductor-based dosimeters
〇(M1)Sora Ito1, Shintaro Ishihara1, Toki Takishita1, Yukimune Uchida1, Sho Toyama1, Misako Miwa1, Kada Wataru1, Matsuyama Shigeo1 (1.QSE, Tohoku Univ.)
Keywords:
semiconductor-based dosimeter,radiation hardness
In particle cancer therapy, clinical dose evaluation requires consideration of not only physical dose but also Linear Energy Transfer (LET), and the implementation of wide bandgap semiconductor solid-state ionization chamber-type dosimeters sensitive to both LET and total energy is anticipated. Toward long-term operation, charged particle irradiation simulating the Bragg peak was performed using the 1 MV tandem accelerator at Tohoku University, and radiation hardness was evaluated through changes in current–voltage characteristics of Si PIN diodes and wide bandgap semiconductor dosimeters.