Presentation Information

2:30 PM - 2:45 PM JST(5:30 AM - 5:45 AM UTC)

[8p-E219-5]Mechanistic Study of Breaking Position Control in Metallic Nanowires via Electromigration

〇Keita Sugimasa^1,2, Yuki Tsutsui^1,2, Hiroshi Suga¹, Hisashi Shima², Yasuhisa Naitoh² (1.Chiba Tech, 2.AIST)

Keywords:

Electromigration,Nanostructure Control,Nanogap

This study aimed to control the fracture position of metal nanowires caused by previously irregular electromigration (EM). We investigated the influence of externally applied electric fields generated by the structure of gate electrodes placed near the metal nanowires. The introduction of a notch structure enabled control of the fracture position, demonstrating that EM is influenced not only by the applied current but also by external electric fields.

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