The 87th JSAP Autumn Meeting 2026
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2:40 PM - 3:20 PM JST
(5:40 AM - 6:20 AM UTC)
[8p-E310-3]
Measurement Technologies for Reducing Environmental Impact and Contributing to the Green Transformation of the Semiconductor Industry
〇Masaya Yoshioka
1
, Nobuyuki Kannan
2
(1.HORIBA, 2.HORIBA STEC)
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Keywords:
DRE measurement,GHG
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