Presentation Information
[9a-E311-6]Site-dependent characterization of photoionization cross-sections for silicon vacancies in 4H-SiC
〇(DC)Kazuki Okajima1, Naoya Morioka1,2, Tetsuri Nishikawa1,2, Hiroshi Abe3, Koichi Murata4, Takeshi Ohshima3,5, Hidekazu Tsuchida4, Norikazu Mizuochi1,2,6 (1.Kyoto Univ., 2.CSRN Kyoto Univ., 3.QST, 4.CRIEPI, 5.Tohoku Univ., 6.QUP KEK)
Keywords:
silicon carbide,silicon vacancy,PDMR
Silicon vacancies (V1 and V2) in 4H-SiC are promising candidates for quantum device applications. However, their charge dynamics have remained elusive. In this study, we evaluated the photoionization characteristics of single V1 and V2 using photocurrent spectroscopy. In this presentation, we will report the excitation wavelength dependence of their respective ionization cross-sections and provide guidelines for selecting the optimal excitation wavelength to enhance the sensitivity of photocurrent detected magnetic resonance (PDMR).
