Presentation Information
[9a-PB1-5]Development of sample holder with temperature gradient application system for local thermoelectric measurements using atomic force microscopy
〇Kosuke Hasegawa1, Isshi Koide1, Hirofumi Yamada2, Yuji Miyato1 (1.Ryukoku Univ., 2.Ctr. of Sci. and Tech. Ryukoku Univ.)
Keywords:
Atomic Force Microscopy,Thermoelectric Material,Temperature Gradient
A temperature-gradient sample holder compatible with atomic force microscopy (AFM) measurements was developed for the local characterization of thermoelectric materials with nanostructures. The holder is equipped with both heating and liquid-nitrogen cooling mechanisms at both ends of the sample, enabling the direction of the temperature gradient to be switched. In addition, temperatures at four locations within the sample holder were monitored using thermocouples, and the temperatures at both ends of the sample were controlled. Preliminary evaluation confirmed that a temperature difference of approximately 50 °C could be established across the sample.