Presentation Information

[9a-PB5-8]Cryo- Ar-GCIB Sputtering for Low-Damage XPS Depth Profilingof MAPbI3 Thin Films

〇Takara Okada1, Senku Tanaka1 (1.Kindai Univ.)

Keywords:

Perovskite solar cells,X-ray Photoelectron Spectroscopy,Gas Cluster Ion Beam