Presentation Information
[9a-PB5-8]Cryo- Ar-GCIB Sputtering for Low-Damage XPS Depth Profilingof MAPbI3 Thin Films
〇Takara Okada1, Senku Tanaka1 (1.Kindai Univ.)
Keywords:
Perovskite solar cells,X-ray Photoelectron Spectroscopy,Gas Cluster Ion Beam
Perovskite solar cells,X-ray Photoelectron Spectroscopy,Gas Cluster Ion Beam