[9p-E204-1~17] 2.1 Radiation physics, Material development and characteristic evaluation

5:15 PM - 5:30 PM JST(8:15 AM - 8:30 AM UTC)

[9p-E204-12] Evaluation of Single-Event Upset in SRAM devices induced by low energy protons using 1 MV tandem accelerator

〇(M2)Shintaro Ishihara¹, Yukimune Uchida¹, Toki Takishita¹, Kosei Suzuki¹, Sho Toyama¹, Wataru Kada¹, Shigeo Matsuyama¹ (1.Sch. Eng. ,Tohoku Univ.)

Keywords:

Single Event Effects (SEEs),Low energy protons,Commercial Off-the-Shelf

Commercial Off-the-Shelf (COTS) devices are increasingly being adopted for low Earth orbit (LEO) missions; however, direct ionization single-event effect (SEE) induced by protons have emerged as a critical concern. Due to process miniaturization in COTS devices, SEEs can be triggered even by particles with low linear energy transfer (LET), yet evaluation data remain insufficient. In the low-LET regime in particular, the cross-section drops sharply and extrapolation from existing data breaks down, making experimental evaluation essential. In this study, SEE evaluation in this regime was conducted using low-energy protons from a 1 MV tandem accelerator.