[9p-E310-1~12] The 40th Anniversary Symposium of STM Nobel Prize and AFM Discovery: Toward the Future of Scanning Probe Microscopy

5:15 PM - 5:35 PM JST(8:15 AM - 8:35 AM UTC)

[9p-E310-12] Development and Applications of “t-SPESI,” a Hybrid Technology Combining Atomic Force Microscopy and Mass Spectrometry

〇Yoichi Otsuka¹ (1.Univ. Osaka)

Keywords:

mass spectrometry imaging

Atomic force microscopy (AFM) is widely used to observe surface morphology and local physical properties with nanometer-scale resolution. In many biological and polymer samples, however, morphology alone is not sufficient, because molecular distributions are closely related to function, pathology, or degradation.To address this issue, we have developed tapping-mode scanning probe electrospray ionization (t-SPESI), which combines key concepts of AFM with electrospray ionization mass spectrometry. In t-SPESI, an oscillating capillary probe locally supplies solvent to the sample surface, extracts molecules through a transient liquid bridge, and converts the extract into gas-phase ions for mass spectrometric detection. Two-dimensional scanning of the probe enables mass spectrometry imaging with local chemical information.In this talk, I will describe the principle and development of t-SPESI and present applications to tissue sections, cultured cells, cancer samples, and polymer materials. I will also discuss how the combination of scanning probe techniques and mass spectrometry can extend SPM from morphological observation to local chemical analysis.