Presentation Information
[15a-PA5-10]Potential-induced Degradation Test of the Large-Area Encapsulant-Free Crystalline Silicon Photovoltaic Modules
〇HAOSEN XU1, Kensaku Maeda1, Keisuke Ohdaira1 (1.JAIST)
Keywords:
Encapsulant-free photovoltaic module,Potential-Induced Degradation
To improve the recyclability of photovoltaic modules, a large-area crystalline silicon solar module without encapsulant was fabricated, and the influence of its structural characteristics on potential-induced degradation (PID) behavior was investigated. The module consisted of a string of five series-connected n-type front-emitter cells, and a PID test setup was constructed in which −1000 V was applied to the cells. In future work, current–voltage (I–V) characteristics after PID stress will be measured to evaluate changes in electrical performance and the PID manifestation behavior in large-area encapsulant-free modules.