[15p-PA3-1~25] 3.7 Optical measurement, instrumentation, and sensor

English Presentation

[15p-PA3-9] Sample Integrated Laser for Optical Thickness Measurement Using Single-Shot Interferometry

〇(D)Preangka Roy^1,2, Bao Dinh Thai¹, Yume Hashimoto¹, Satoe Murazawa¹, Satoshi Kanai¹, Tatsutoshi Shioda¹ (1.Saitama Univ., 2.Khulna Univ.)

Keywords:

optical thickness,Fabry-Perot etalon,single-shot interferometer

We present a novel light source for measuring the optical thickness of a high-finesse Fabry-Perot etalon using single-shot interferometry. By integrating the sample etalon into the laser cavity, the system successfully overcame the sensitivity limitations of the rear surface reflection signal.