Presentation Information
[16a-70A_101-3]Fermi Surface Analysis Using Principal Component Analysis and Anomaly Detection
Daichi Ishikawa1, 〇Kentaro Fuku1,2, Yoshio Miura3,4, Yasuhiko Igarashi5, Yuma Iwasaki3, Yuya Sakuraba3, Koichiro Yaji3,6, Alexandre Lira Foggiatto1, Takahiro Yamazaki1, Naoka Nagamura1,3,6, Masato Kotsugi1 (1.Tokyo Univ. of Science, 2.Nagoya Univ., 3.NIMS, 4.KIT, 5.Tsukuba Univ., 6.Tohoku Univ.)
Keywords:
machine learning,electronic structure
The Fermi surface (FS) is central to understanding electronic properties, however, its analysis remains expertise-intensive and increasingly burdensome in high-throughput studies. We present a compact, data-driven framework that combines principal component analysis (PCA) with anomaly detection to extract correlations between FS morphology and physical properties. We apply the method to the Heusler alloy Co2MnGaxGe1-x using FS images constructed from first-principles calculations. In the PCA space, we observe discontinuous changes in FS features that strongly correlate with extrema and inflection points of the spin polarization changes. Anomalies around x = 0.94–0.95 are attributed to the emergence of a nodal line; difference analysis visualize the nodal-line location. Robustness tests confirm stable detection performance. Finally, applying to experimental graphene data demonstrates Dirac-point detection, highlighting the method’s applicability to real ARPES datasets.
