Presentation Information

[16p-W9_325-6]Multilayer structure to suppress growth of localized defects in YBa2Cu3O7 superconducting tape

〇Soma Suzuki1, Tomoya Horide1, Yutaka Yoshida1 (1.Nagoya Univ.)

Keywords:

YBCO thin film,crystal orientation

In the fabrication of REBCO coated conductors, it is difficult to completely eliminate defects during long-time deposition; however, suppressing the growth of defects can mitigate the degradation of IC. In this study, we focus on a multilayer structure to suppress defect growth. Here, we introduced an STO layer on an underlying YBCO layer containing a-axis grains to suppress the further growth of a-axis oriented grains. The orientation and the surface structure of the multilayer film were evaluated to discuss the influence of the STO layer on the defect growth.

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