[16p-WL1_401-1~12] (Public Symposium) Attention Job Seeking Students! Exploring the Fusion of AI and Semiconductors: Scientific Insights and Engineering Challenges

3:20 PM - 3:30 PM JST(6:20 AM - 6:30 AM UTC)

[16p-WL1_401-6] AI-Driven Innovation in Semiconductor Metrology Software Development

〇Kohei Jono¹ (1.Hitachi High-Tech)

Keywords:

semiconductor metrology,AI,software development