Presentation Information
[17a-M_374-10]Giant Perpendicular Magnetic Anisotropy in Mo / Boron-rich CoFeB / MgAl2O4 Heterostructure for p-MTJ integration to 5-7 nm CMOS Processes
〇Sho Kagami1, Zhang Ruixian1, Daiki Ito1, Quang Le2, Brian York2, Cherngye Hwang2, Xiaoyong Liu2, Son Le2, Maki Maeda3, Tuo Fan3, Yu Tao3, Hisashi Takano3, Pham Nam Hai3 (1.Science Tokyo, 2.W.D. Inc., Great Oaks, 3.W.D. Inc., Fujisawa)
Keywords:
CMOS,Magnetic Tunnel Junction,Perpendicular Magnetic Anisotropy
Perpendicular magnetic tunnel junctions (p-MTJs) with perpendicular magnetic anisotropy (PMA) are essential building blocks for the scaling of magnetoresistive random access memory (MRAM). However, in conventional CoFeB/MgO structures, the magnetic anisotropy field Hk is about 4–6 kOe and the effective magnetic anisotropy energy coefficient Keff is about 3×106–5×106 erg×cm-3, hindering further device miniaturization beyond the 16 nm CMOS process. In this study, by combining a boron-rich Co19Fe56B25 with a boron-blocking Mo layer and a boron-absorbing MgAl2O4 layer, we demonstrate a giant PMA with Hk = 17.5–19.5 kOe and Keff = 6.9 × 106–9.4 × 106 erg/cm3 for a single CoFeB, which is compatible with the 7 nm CMOS process. Furthermore, by employing a double-CoFeB-layer structure, the minimum MTJ diameter can be reduced to 14.5 nm, demonstrating compatibility with the advanced 5 nm CMOS process.
