[17a-PA2-1~26] 6.4 Thin films and New materials

[17a-PA2-8] Estimation of Thermal Conductivities using Infrared Spectroscopy for LaNiO₃ thin films

〇(B)Sayuri Yonehara¹, Zaizen Haruka¹, Nagai Masaya², Asida Masaaki², Ohta Hiromichi⁴, Li Hao-Bo^1,3, Tanaka Hidekazu^1,3 (1.SANEKEN,The Uni.of Osaka, 2.Eng. Sci.The Uni.of Osaka, 3.OTRI,The Uni.of Osaka, 4.IRIES, Hokkaido Univ.)

Keywords:

strongly correlated system,epitaxial thin film,thin-film materials characterization

We derived the optical conductivity σ(ω) from FTIR reflectivity spectra of a LaNiO₃ thin film (~80 nm) grown by pulsed laser deposition (PLD) and extracted transport parameters by fitting the spectra with the Drude–Smith model. Using these parameters, the electronic thermal conductivity was estimated via the Wiedemann–Franz law and found to be consistent with the thermal conductivity κ measured by time-domain thermoreflectance (TDTR). This study demonstrates a non-contact approach to evaluate electron-dominated heat transport, and the method will be extended to investigate scattering mechanisms and hydrogenated systems.