[17a-WL1_301-1~11] 12.7 Biomedical Engineering and Biochips

10:45 AM - 11:00 AM JST(1:45 AM - 2:00 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[17a-WL1_301-7] Patch-Clamp Analysis of Membrane Electrical Properties in Oxidative Stress–Induced Senescent Cells

〇JIAJUN YU¹, IPPEI YAGI¹, SATOSHI UCHIDA¹ (1.Tokyo Metropolitan Univ.)

Keywords:

Auto Patch-clamp technique,Membrane electrical properties,Cellular senescence

Cellular senescence induced by oxidative stress is suggested to alter membrane structure and compromise electrical stability. In this study, cells with different senescence levels were induced using H2O2 and evaluated by automated patch clamp measurements. Membrane resistance, capacitance, and electrical breakdown behavior were analyzed under stepwise voltage pulses. Irreversible current jumps and a significant increase in membrane capacitance were observed only in cells treated with 1000 uM H2O2, indicating membrane dielectric breakdown. These results demonstrate that severe oxidative stress markedly reduces the electrical tolerance of senescent cells, whereas moderate senescence preserves membrane stability.