[17p-70A_101-1~9] (Public Symposium) From Space Development to Space Industry: Insights for Business Entry and the Latest Technological Trends

4:35 PM - 5:05 PM JST(7:35 AM - 8:05 AM UTC)

[17p-70A_101-7] Toward Silicon Integrated Systems Resistant to Cosmic Radiation–Induced Faults

〇Masanori Hashimoto¹ (1.Kyoto Univ.)

Keywords:

soft error,radiation,integrated circuits

This talk presents recent research toward silicon integrated systems resilient to cosmic radiation–induced failures. We overview soft-error impact evaluation using COTS Edge AI SoCs and discuss the limits of estimation accuracy, lightweight hardware error detection based on control-flow specifications, and reliability analysis through fault injection and software–hardware co-design. In addition, case studies of radiation-hardened AI SoCs and self-healing image sensors for space applications are introduced to illustrate directions for integrated radiation-resilient system design.