Presentation Information

[18p-M_B104-7]Thermal stability of spontaneous orientation polarization in multilayer device structures

〇Yuki Fujisawa1, Yutaka Noguchi1,2 (1.SST,Meiji Univ., 2.GSST,Meiji Univ.)

Keywords:

Spontaneous Orientation Polarization,Thermal stability,DCM

In this study, we fabricated multilayer devices using Alq3 and OXD-7, which exhibit spontaneous orientation polarization (SOP), as the electron transport layers. We evaluated the thermal stability of SOP during annealing using displacement current measurement and simultaneous PL intensity measurement (DCM-PL method). These results clarified the relationship between the relaxation and disappearance of SOP and the glass transition temperature (Tg) of each layer.