Presentation Information
[1D10]High sensitivity and high throughput microscopy: Chip-based technologies for precise control
of sample temperature and illumination
*Pierre Türschmann1, *Noel Fitzgerald1 (1. Interherence)
Password required to view
Abstract password authentication.
Password is required to view the abstract. Please enter a password to authenticate.
Password is required to view the abstract. Please enter a password to authenticate.