Presentation Information
[2P25]Comparison of transmission electron microscopy images and backscattered electron images obtained by scanning electron microscopy
*Tomohiro Haruta1, Rintaro Kawano1 (1. JEOL Ltd.)
Keywords:
TEM,SEM
Password required to view
Abstract password authentication.
Password is required to view the abstract. Please enter a password to authenticate.
Password is required to view the abstract. Please enter a password to authenticate.