Presentation Information
[G3-O202-07]Reliable Multilevel Resistance States in TaOx-Based RRAM Enabled by Pulse Modulation and Filament Dynamics Simulation
*Kuan-Han Lin1 (1. Department of Materials Science and Engineering, National Cheng Kung University (Taiwan))
Keywords:
resistive switching,multilevel states,filament evolution,COMSOL simulation
