Presentation Information

[G3-P203-19]Correlation Between Oxygen-Derived Defects and Hysteresis Window in p-Type TeOX TFT

*Kazuho Ishi1, Yoshikazu Shin1, Shinya Aikawa1 (1. Kogakuin Univ. (Japan))

Keywords:

Thin-film transistors,TeOx,p-Type,Oxide semiconductors,Oxygen-derived defects