Presentation Information
[G5-P203-14]Ge2Sb2Te5-crystallization-induced stress effect on insulator-metal transition temperature in VO2 films grown on Al2O3 (001)
*YIQI LIU1, Kunio Okimura1, Keisuke Kudo1, Joe Sakai2, Masashi Kuwahara3, Satoshi Katano4, Yuji Muraoka5 (1. Tokai Univ. (Japan), 2. Toshima Manufac. Co., Ltd. (Japan), 3. National Institute of Advanced Indus. (Japan), 4. Toyo Univ. (Japan), 5. Okayama Univ. RIIS (Japan))
Keywords:
VO2,GST,IMT,RSM