[ThD1] Hybrid Integration II and Advanced Materials

9:45 AM - 10:00 AM JST(12:45 AM - 1:00 AM UTC)

[ThD1-3] Mitigating TPA-induced Instability in III-V/Si Hybrid Laser via Reverse-biased PIN Junctions

○Yihao Fan¹, Yuyao Guo^1,2, Xinhang Li¹, Siyu E¹, Weihan Xu¹, Minhui Jin¹, Liangjun Lu^1,2, Yu Li^1,2, Jianping Chen^1,2, Linjie Zhou^1,2 (¹Shanghai Jiao Tong Univ., ²SJTU-Pinghu Institute of Intelligent Optoelectronics)

Keywords:

Semiconductor lasers,photonic integration

We demonstrate a III-V/Si external cavity laser incorporating PIN junctions within silicon microring resonators. By sweeping the TPA-induced carriers using reverse PIN junction, the laser exhibits superior performance compared with its unbiased counterpart.