[WD3] Integrated Photonic Circuits and Platforms III

2:00 PM - 2:30 PM JST(5:00 AM - 5:30 AM UTC)Invited

[WD3-1] Reliability Challenges for the Next Generation of Optical Communication Devices

○William Fegadolli¹ (1. Nokia (United States of America))

This paper presents a retrospective, current state, and forward-looking perspective on optical interconnectivity in data communications and telecommunications. It highlights reliability challenges addressed in current state-of-the-art technologies and explores the hurdles ahead from a technology
evolution perspective.