Session Details

Surface Inspection

Wed. Apr 23, 2025 9:00 AM - 10:15 AM JST
Wed. Apr 23, 2025 12:00 AM - 1:15 AM UTC
213 (Conference Center)
Session Chair: Naila Zahra, Jessica Onaka

[OPTM5-01(Invited)]Measurement Technique for Scattering Characteristics of Surface Defects of Optical Components

*Weiguo Liu1, JING YAO HOU1, Shun Zhou1, Xueping Sun1, Jin Cheng1 (1. Xian Technological University)

[OPTM5-02]Surface detection based on autofluorescence signal for 3-dimensional measurement

*Masaki Michihata1, Kensuke Kawami1, Motoya Yoshikawa1, Shuzo Masui1, Satoru Takahashi1 (1. The University of Tokyo)

[OPTM5-03]3D detection of surface defects on ultra-precision curved optical elements based on micro structured-light

*Xi Hou1,2,3, Mingze Li1,2,3, Wenchuan Zhao1,2,3, Shuai Zhang1,2,3 (1. National Key Laboratory of Optical Field Manipulation Science and Technology, Chinese Academy of Sciences, 2. Institute of Optics and Electronics, Chinese Academy of Sciences, 3. University of Chinese Academy of Sciences)

[OPTM5-04]Non-Destructive Spectral Reflectance Measurements of Antireflection Coating on Optical Lenses with Small Radius of Curvature

*Boonsong Sutapun1, Lawan Sampanporn1 (1. Suranaree University of Technology)