Short presentation for poster session-2

9:15 AM - 9:20 AM JST(12:15 AM - 12:20 AM UTC)

[LEDIA4-04] Identification of killer defects in AlGaN-based UV-B laser diodes through one-to-one correlation between crystal defects and device characteristics

*Seiya Kato¹, Takumu Saito¹, Rintaro Miyake¹, Shundai Maruyama¹, Yusuke Sasaki¹, Shogo Karino¹, Shion Kamiya¹, Naoki Kitta¹, Ryota Watanabe¹, Yuma Miyamoto¹, Sho Iwayama¹, Hideto Miyake², Satoshi Kamiyama¹, Tetsuya Takeuchi¹, Motoaki Iwaya¹ (1. Meijo University, 2. Mie University)