Optics & Metrology 2

3:40 PM - 3:55 PM JST(6:40 AM - 6:55 AM UTC)

[XOPT3-04] Wavefront and rocking-curve imaging characterization of plasma-polished Si(111) channel-cut crystal for the European XFEL hard X-ray monochromators

*Kelin Tasca¹, Nazanin Samadi², Dmitri Novikov², Jana Raabe², Liubov Samoylova¹, Thu Nhi Tran-Caliste³, Silja Schmidtchen¹, Azat Khadiev², Xianbo Shi⁴, Maurizio Vannoni¹, Harald Sinn¹ (1. European XFEL, 2. Deutsches Elektronen-Synchrotron DESY, 3. European Synchrotron Radiation Facility (ESRF), 4. Argonne National Laboratory (ANL))