Session Details

Optics & Metrology 2

Tue. Apr 21, 2026 2:40 PM - 3:55 PM JST
Tue. Apr 21, 2026 5:40 AM - 6:55 AM UTC
313+314 (Pacifico Yokohama Conference Center)
Session Chair: Ray Barrett (ESRF)

[XOPT3-01(Invited)]X-ray wavefront diagnostics for beamline commissioning and optics optimization at the APS

*Xianbo Shi1, Yu-Chung Lin1, Luca Rebuffi1, Lahsen Assoufid1 (1. Advanced Photon Source, Argonne National Laboratory)
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[XOPT3-02]Resonant Inelastic X-ray Scattering Instrumentation at European XFEL

*Natalia Gerasimova1, Justine Schlappa1, Andrey Sokolov2, Daniele La Civita1, Maurizio Vannoni1, Benjamin Van Kuiken1, Jan Torben Delitz1, Andreas Scherz1 (1. European XFEL, 2. Helmholtz-Zentrum Berlin für Materialien und Energie)
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[XOPT3-03]Recent upgrade for X-ray optics and metrology development at NSLS-II

*Mourad Idir1, Lei Huang1, Tianyi Wang1, Corey Austin1, Yi Zhu1 (1. BNL/NSLS-II)
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[XOPT3-04]Wavefront and rocking-curve imaging characterization of plasma-polished Si(111) channel-cut crystal for the European XFEL hard X-ray monochromators

*Kelin Tasca1, Nazanin Samadi2, Dmitri Novikov2, Jana Raabe2, Liubov Samoylova1, Thu Nhi Tran-Caliste3, Silja Schmidtchen1, Azat Khadiev2, Xianbo Shi4, Maurizio Vannoni1, Harald Sinn1 (1. European XFEL, 2. Deutsches Elektronen-Synchrotron DESY, 3. European Synchrotron Radiation Facility (ESRF), 4. Argonne National Laboratory (ANL))
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