Session Details

Polarimetry and Ellipsometry

Wed. Apr 22, 2026 10:30 AM - 12:00 PM JST
Wed. Apr 22, 2026 1:30 AM - 3:00 AM UTC
213 (Pacifico Yokohama Conference Center)
Session Chair: Masaki Michihata, Markus Schake

[OPTM7-01(Invited)]Geometric phase elements and their application to polarimetry

*Moritsugu Sakamoto1,2, Kohei Noda1,2, Tomoyuki Sasaki1,2, Nozomi Nishizawa2,3, Nobuhiro Kawatsuki2,4, Hiroshi Ono1,2 (1. Nagaoka University of Technology, 2. CREST, JST, 3. Kitasato University, 4. University of Hyogo)
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[OPTM7-02]Towards spin Hall effect of light ellipsometry for in-situ multilayer film growth monitoring

*Naila Zahra1,2, Yasuhiro Mizutani1, Tsutomu Uenohara1, Yasuhiro Takaya1, Tadashi Hatano3, Takeo Ejima3 (1. The University of Osaka, 2. Institut Teknologi Bandung, 3. Tohoku University)
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[OPTM7-03]Angle-scanning micro-spot ellipsometry with hybrid metrology
strategies for critical dimension measurement of HAR microstructures

Yuan-Ci Lin1, Fu-Sheng Yang1, Bo-Chen Kuo2, *Ting-Hui Huang1, Surajit Das2, . Manutious2, Liang-Chia Chen1,2 (1. Department of Mechanical Engineering, National Taiwan University, Taiwan, 2. Graduate School of Advanced Technology (GSAT), National Taiwan University, Taiwan)
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[OPTM7-04]Snapshot Mueller Matrix Polarimetry Using a Spatial Light Modulator and a Division-of-Focal-Plane Polarization Camera

*Manning Sun1, Shin Nakui1, Jessica Onaka1, Yukitoshi Otani1 (1. Utsunomiya University)
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[OPTM7-05]Polarization Calibration of Fisheye Lenses Using a Full-Stokes Polarization Camera

*Manning Sun1, Jessica Onaka1, Nathan Hagen1, Yukitoshi Otani1 (1. Utsunomiya University)
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