Presentation Information
[P01-08]aixSCAN: A New Standard Turnkey Solution in MEMS Testing and Characterization
*Peter Mardilovich1, Tom Kremers1, Roland Kessels1, Carlos Fragkiadakis1, Thorsten Schmitz-Kempen1, Stephan Tiedke1 (1. aixACCT Systems)
Comment
To browse or post comments, you must log in.Log in