[Th3d-O32] Sub area 3-2: Modules and related technologies

3:00 PM - 3:15 PM JST(6:00 AM - 6:15 AM UTC)

[Th3d-O32-04] Influence of aging test on curved crystalline Si photovoltaic unencapsulated modules with polycarbonate base

*Yo Yamakawa¹, Kazuma Ito¹, Yasuhiro Okada², Yohei Ogashiwa², Hiroaki Takahashi², Naoshi Kimura³, Shuntaro Shimpo⁴, Mitsunori Nagahara⁴, Keisuke Ohdaira⁴, Kazuhiro Gotoh^1,5, Atsushi Masuda^1,5 (1. Grad. School Sci. Tech., Niigata University (Japan), 2. Kyocera Corp. (Japan), 3. Okitsumo Inc. (Japan), 4. JAIST (Japan), 5. IRCNT, Niigata University (Japan))