Presentation Information
[Tu3-P32-02]Evaluation of temperature dependent stress around electrodes in crystalline silicon solar cells by Raman spectroscopy
*Koki Hasebe1, Ryo Yokogawa1,4, Kyotaro Nakamura2, Yoshio Ohshita2, Noboru Yamada3, Atsushi Ogura1,4 (1. Meiji university (Japan), 2. Toyota Technological Institute (Japan), 3. Nagaoka University of Technology (Japan), 4. Meiji Renewable Energy Laboratory, Meiji University (Japan))