Presentation Information
[P-05]Self-Heating and Radiation Hardness Studies of 3nm GAA-FET-Based SRAM with Different Substrate Isolation Techniques
*Albert Lu1, Junipero Verbeke1, Phil Oldiges2, Reza Arghavani2, Hiu Yung Wong1 (1. San Jose State University, 2. Sandia National Laboratories)
Comment
To browse or post comments, you must log in.Log in