[Session 1] Session 1: Memory Devices

2:10 PM - 2:30 PM JST(5:10 AM - 5:30 AM UTC)

[Session_1-04] Compact Modeling of the Program Saturation Regime in
Charge Trap Flash Memories

*Thomas Hellemans^1,2, Devin Verreck^1,2, Antonio Arreghini¹, Geert Van den bosch¹, Maarten Rosmeulen^1,2, Michel Houssa^2,1, Jan Van Houdt^1,2 (1. Imec, 2. KU Leuven)