Presentation Information

[Session_10-03]A Unified Physical Model for Bias Temperature Instability in OSFETs

*Yongjia Wang1, Haotong Zhu1, Jinghan Xu1, Ligong Zhang1, Jinfeng Kang1, Xiaoyan Liu1 (1. Peking Univ.)

Comment

To browse or post comments, you must log in.Log in