Presentation Information
[Session_9-04]Impact of Thermal Expansion Mismatch-Induced NMOS Metal Gate Stress on MBCFET Performance
*Sung-Ho Kim1, Sooyoung Park1, Chang Ju Moon1, Jong Su Kim1, Jaehong Lee1, Yoon-Suk Kim1, Seung Hyun Song1, Yonghee Park1, Jaehoon Jeong1 (1. Samsung Electronics Corp., Ltd.)
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