Presentation Information
[6-07]An Experimental Study on Hot-hole Injection (HHI) in Floating-gate (FG) Flash Memory
*Chang Chen1, Yang Feng1, Jixuan Wu1, Jing Liu2, Junyu Zhang3, Xuepeng Zhan1, Jiezhi Chen1 (1. Shandong University (China), 2. Institute of Microelectronics of Chinese Academy of Sciences (China), 3. Neumem Co., Ltd (China))
Comment
To browse or post comments, you must log in.Log in