Presentation Information
[6-18]Reliability Analysis of CFETs Under Various NBTI Conditions
*Hsiang-Ting Kung1, Narasimhulu Thoti2, Hannu-Pekka Komsa2, Ying-Tsan Tang1 (1. Department of Electrical Engineering, National Central Univ. (Taiwan), 2. Microelectronics Res. Unit, Faculty of Info. Tech. and Electrical Engineering, Univ. of Oulu (Finland))
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