[6] Poster Session

[6-20] Quantitative Analysis of Endurance–dependent Charge Trapping Dynamics in Ferroelectric Field–Effect Transistors with Temperature Effects

*Hyojin Yang¹, Haesung Kim Kim¹, Changhyeon Han², Yoon Jung Lee¹, Sung-Jin Choi¹, Dae Hwan Kim¹, Dong Myong Kim^1,4, Daewoong Kwon², Jong-Ho Bae³ (1. Kookmin Univ. (Korea), 2. Hanyang Univ. (Korea), 3. Yonsei Univ. (Korea), 4. Daegu Gyeongbuk Inst. of Sci. & Tech. (Korea))