[8] Advanced CMOS Devices

11:05 AM - 11:25 AM JST(2:05 AM - 2:25 AM UTC)

[8-02] Statistical Analysis of Subthreshold Current Distributions in bulk MOSFETs at Room and Cryogenic Temperatures

*Tomoko Mizutani¹, Kiyoshi Takeuchi¹, Takuya Saraya¹, Hiroshi Oka², Takahiro Mori², Masaharu Kobayashi¹, Toshiro Hiramoto¹ (1. Univ. of Tokyo (Japan), 2. AIST (Japan))