[8] Advanced CMOS Devices

11:25 AM - 11:45 AM JST(2:25 AM - 2:45 AM UTC)

[8-03] Investigation on Enhanced Hot Carrier Degradation in FinFETs at Cryogenic Temperature

*Zirui Wang¹, Zuoyuan Dong^1,2, Hongbo Wang¹, Zixuan Sun¹, Yue-Yang Liu³, Xing Wu², Runsheng Wang¹ (1. Peking Univ. (China), 2. East China Normal Univ. (China), 3. Inst. of Semiconductors (China))