[9] Interfaces and Reliability Engineering

1:30 PM - 1:55 PM JST(4:30 AM - 4:55 AM UTC)

[9-01] Charge pumping electrically-detected magnetic resonance in Si MOS transistors
— Identification of interface defects and dopant atoms —

*Masahiro Hori¹ (1. Shizuoka Univ. (Japan))