[9] Interfaces and Reliability Engineering

2:15 PM - 2:35 PM JST(5:15 AM - 5:35 AM UTC)

[9-03] Total Ionizing Doses Effects on MOSFET, FinFET, and GAAFET after Co-60 Radiation Exposure

*Jing-Lin Zheng¹, Dun-Bao Ruan², Kuei-Shu Chang-Liao¹, Shang-Hua Hsu¹ (1. National Tsing Hua Univ. (Taiwan), 2. Fuzhou Univ. (China))